Equipment Guide > Scanning Electron Microscopy

Scanning Electron Microscopy

Scanning electron microscopy (SEM) is an analysis technique which obtains information about composition and topography of an object by scanning its surface to create a high-resolution image.

SEM uses a focused beam of electrons to do this. The resulting images show information about what the object is made of and its physical features. SEM has a broad range of applications, across several industries and sectors.

• A suite of high resolution Field Emission Scanning Electron Microscopes (FE-SEM) are available

These scanning electron microscopes are complimented with the latest technology, including:

• Wavelength Dispersive Spectroscopy (WDS) and Electron Diffraction Spectroscopy (EDS) detectors offering light element analysis
• Electron Back-scatter Diffraction (EBSD) - 1400°C stage, in-situ hot tensile stage
• Environmental Scanning Electron Microscopy (ESEM)

FEI Quanta 650 w/Scanning Electron Microscope

• Oxford Instruments Ultimax 100 EDS detector
• In-situ 1400°C stage
• ESEM Mode

Applications and Capability

• Microstructural analysis
• Fracture analysis
• Qualitative and semi-qualitative compositional analysis
• In-situ analysis for microstructural transformations at elevated temperature or under strain conditions
• ESEM mode for non-metallic, non-conductive or biological samples

Key Features

• Field Emission Gun SEM provides high resolution, high magnification analysis even at low accelerating voltages
• Light element analysis to Li detection using Wavelength Dispersive Microscopy and Electron Diffraction Spectroscopy
• Electron Back-scatter Diffraction analysis
• In-situ elevated temperature analysis (up to 1400°C)
• Environmental Scanning Electron Microscope analysis

Equipment

Zeis Sigma 300 w/Scanning Electron Microscope

• Oxford Instruments Symmetry S2 EBSD
• Oxford Instruments AztecWave WDS & Ultimax 170 EDS detector
• In-situ hot tensile stage (up to 1400°C)